제27회 한국테스트학술대회

2026년 7월 7일(월) / 서울 그랜드워커힐 호텔 비스타, 그랜드홀

프로그램

행사 주요일정
  • 논문제출 마감일
    2026. 5. 21(목) 까지
  • 논문채택여부 통보
    2026. 6. 5(금) 까지
  • 논문발표자료 마감일
    2026. 6. 16(화) 까지
  • 사전등록 마감일
    추후 공지 예정

TODAY 2026. 05. 14

제27회 한국테스트학술대회

D-54

튜토리얼

Why Silicon Photonics & Co-Packaged Optics Matter: Power Scaling Limits, Hyperscaler Demand, and High-Volume Optical Test Challenges

오종익

  • - Director of Engineering, Diagnosis & Yield Learning, Siemens EDA
Career Experience
  • 2018 ~ Present
    Teradyne, FPS- Field Product Specialist
  • 2011 ~ 2018
    Teradyne, Sr. RF Application engineer
  • 1999 ~ 2011
    Amkor Technology Korea TDE (Test Development Engineering)
  • 1995 ~ 1999
    Hyundai Semiconductor, CVD process engineer
  • 1988 ~ 1995
    University of Seoul, Bachelor’s degree, Material Science and Engineering

Diagnosis-Driven Yield Analysis for Identifying Systematic Defects and Improving Yield

한동관

  • - Director of Engineering, Diagnosis & Yield Learning, Siemens EDA
Education
  • M.S. in Electronic Engineering, Yonsei University, Korea
  • B.S. in Electronic Engineering, Sungkyunkwan University, Korea
Career Experience
  • 2024 ~ Present
    Director of Engineering, Diagnosis & Yield Learning
    - Leading the development of volume diagnosis and marginal failure analysis solutions for yield learning.
  • 2016 ~ 2024
    Principal DFT Engineer, Design Technology Team
    - Led the development of DFT, synthesis, and silicon lifecycle management solutions.
  • 2008 ~ 2015
    Senior DFT Engineer, Design Technology Team
    - Developed memory test solutions.
  • 2000 ~ 2007
    DFT Engineer, Design Technology Team
    - Developed logic test and diagnosis solutions.

Test Distribution Strategies for AI-Driven Semiconductors

박성종

  • - SoC System Sales & BD_TA team Manager, Advantest Korea
Career Experience
  • 2024 ~ Present
    Advantest Korea SoC Sales & BD_TA (V93K, OSAT/IDM/Fabless support)
  • 2010 ~ 2024
    Advantest Korea SoC SE (V93K Test Engineering for Global OSAT & IDM)
  • 2004 ~ 2010
    Amkor Technology Korea TDE (RFIC Test Development Engineering)
  • 2000 ~ 2004
    Daewoo Semiconductor FAE (General Purpose IC & RFIC Evaluation)
  • 1994 ~ 2000
    DKU (Dankook University, Bachelor of Science in Electrical Engineering)

Integrated Methodology and Challenges for Evaluation and Screening in High-Performance SoC Products

김정태

  • - 삼성전자
Education
  • 2023
    고려대 경영석사(Executive MBA)
  • 2010
    성균관대 공학 석사(반도체디스플레이공학)
  • 2003
    광운대 공학 학사(반도체 신소재공학)
Career Experience
  • 2022 ~
    삼성전자 Foundry 사업부 제품기술팀 Foundry PTE PL
  • 2017 ~
    삼성잔자 S.LSI 사업부 제품기술팀 SOC PE TL
  • 2014 ~
    14nm FinFET 적용 AP Flagship 과제 양산화
  • 2010 ~
    Product MHC(Model to Hardware Correlation) Index 개발
  • 2008 ~
    DFT Test Low Power 설계 기법 연구(성균관대)
  • 2005 ~
    DFT SCAN eFA 분석 및 Signal Probing 분석 기법 개발 도입
  • 2003 ~
    Media/AP향 과제 Product Engineering(평가/분석)
    • FinFET / GAA 선단 공정 적용 Flagship SOC 과제 최초 개발 양산화
    • Automotive 검증/선별 방법론 구축
    • SRAM Repair 알고리즘 최적화 기법 도입
    • HBM/HPC BIG Die 과제 양산화
    • 품질/성능/수율 통합 검증 방법론 정립